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Papers tagged with "Test Program"
Vol 4, Issue 7 (July 2018)
IC Testing
A FAST APPROACH TOWARDS TEST PROGRAM GENERATION FOR MIXED SIGNAL IC
In VLSI Industries The Cost Of The Product Depends On The Several Factors Like Silicon Cost, Packaging Cost And Testing Cost. Testing Cost Can Be Reduced By The Simplification Of The Test Program Development For The Automatic Tester Equipme...
Sanjeevkumar Naik