Study And Analysis Probability Of Soft Error In Combinational Circuits Using Nor Gate

• Author(s):

  Poonam S.Wankhede | Asst.Prof.Mrs.Usha Jadhav

• Keywords:

  Soft Error, Stuck-at-faults, Tolerate, Probability Of Failure, Masking Factors.

• Abstract:

  As The Model Technology Is Being Scaled Down, Physical Defects Occur. Physical Defects Are Those That Can Occur In A Circuit. During Fabrication Of Chip Many Types Of Imperfection Can Occur, For Example, Breaks In Signal Lines, Lines Shorted. Soft Error

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Other Details

• Paper id:

  IJSARTV3I514246

• Published in:

  Volume: 3 Issue: 5 May 2017

• Publication Date:

  2017-05-13

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