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Volume 10 Issue 12 December 2024


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STUDY AND ANALYSIS PROBABILITY OF SOFT ERROR IN COMBINATIONAL CIRCUITS USING NOR GATE

  • Author(s):

    Poonam S.Wankhede | Asst.Prof.Mrs.Usha Jadhav

  • Keywords:

    Soft Error, Stuck-at-faults, Tolerate, Probability Of Failure, Masking Factors.

  • Abstract:

    As The Model Technology Is Being Scaled Down, Physical Defects Occur. Physical Defects Are Those That Can Occur In A Circuit. During Fabrication Of Chip Many Types Of Imperfection Can Occur, For Example, Breaks In Signal Lines, Lines Shorted. Soft Error

Other Details

  • Paper id:

    IJSARTV3I514246

  • Published in:

    Volume: 3 Issue: 5 May 2017

  • Publication Date:

    2017-05-13


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