Aging-aware Reliable Multiplier Design With Adaptive Hold Logic

• Author(s):

  Pranali G. Gahukar | Prof. Ashish Maske

• Keywords:

  Adaptive Hold Logic (AHL), Negative Bias Temperature Instability (NBTI), Positive Bias Temperature Instability (PBTI), Reliable Multiplier, Variable Latency.

• Abstract:

  High Speed And Low Power Consumption Is One Of The Most Important Design Objectives In Integrated Circuits. Digital Multipliers Are Most Critical Functional Units. The Overall Performance Of This System Depends On The Throughput Of Multiplier Design. Agin

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Other Details

• Paper id:

  IJSARTV3I717153

• Published in:

  Volume: 3 Issue: 7 July 2017

• Publication Date:

  2017-07-29

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