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Volume 10 Issue 12 December 2024


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A FAULT TOLERANCE TECHNIQUE FOR COMBINATIONAL AND SEQUENTIAL CIRCUITS USING TRIPLE MODULAR REDUNDANCY TECHNIQUE

  • Author(s):

    Santhosh kumar | G.Bharathidhasan | S.Saravanan | N.Sidhuraj

  • Keywords:

  • Abstract:

    Reliability Is One Of The Most Critical Factors That Have To Be Considered During The Designing Phase Of Any IC. In Critical Applications Like Medical Equipment & Military Applications This Reliability Factor Plays A Very Critical Role In Determining The

Other Details

  • Paper id:

    IJSARTV4I321742

  • Published in:

    Volume: 4 Issue: 3 March 2018

  • Publication Date:

    2018-03-22


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