A FAST APPROACH TOWARDS TEST PROGRAM GENERATION FOR MIXED SIGNAL IC

• Author(s):

  Sanjeevkumar Naik

• Keywords:

  Mixed Signal IC, ATE, Test Program, Time To Market

• Abstract:

  In VLSI Industries The Cost Of The Product Depends On The Several Factors Like Silicon Cost, Packaging Cost And Testing Cost. Testing Cost Can Be Reduced By The Simplification Of The Test Program Development For The Automatic Tester Equipment(ATE). The Ex

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Other Details

• Paper id:

  IJSARTV4I724536

• Published in:

  Volume: 4 Issue: 7 July 2018

• Publication Date:

  2018-07-25

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