Hybrid Test Point Insertion, Analysis And Bench-marking For Dft Coverage Improvement

• Author(s):

  Vinay C Chowkimath | Ashwini V | Swamy Guthal

• Keywords:

  Dft, Test Coverage, Test Point Insertion, Versa Points

• Abstract:

  In The Present Era Of Very Complex Integrated Circuits, DfT (Design For Testability) Plays A Very Important Role In Ensuring The Reliability Of The Integrated Circuits. The Reliability In The Context Of DfT Is Measured In Terms Of Test Coverage Of The Des

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Other Details

• Paper id:

  IJSARTV4I724534

• Published in:

  Volume: 4 Issue: 7 July 2018

• Publication Date:

  2018-07-25

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