HIGHER LEVEL MEMORY WORTHY TOWARDS MORE CELLULAR NETWORKS

• Author(s):

  S.Hemanth | Sakunthala.D

• Keywords:

  Decimal Algorithm, Error Correction Codes (ECCs), Mean Time To Failure (MTTF), Memory, More Than One Cells Upsets (MCUs).

• Abstract:

  Transient A Couple Of Cellphone Upsets (MCUs) Are Fitting Number One Issues Inside The Reliability Of Memories Uncovered To Radiation Environment. To Avert MCUs From Inflicting Facts Corruption, Extra Elaborate Error Correction Codes (ECCs) Are Greatly Us

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Other Details

• Paper id:

  IJSARTV3I717135

• Published in:

  Volume: 3 Issue: 7 July 2017

• Publication Date:

  2017-07-26

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