A UNIFIED METHOD FOR DIGITAL SUPER RESOLUTION AND RESTORATION OF IR MICROSCOPY IMAGING

• Author(s):

  Jeevapriya.V | Jayapriya.S | K. K. Senthilkumar

• Keywords:

• Abstract:

  Infrared (IR) Imaging Systems Resulted In Degraded Imagery Since It Uses Focal Plane Array And IR Sensor In IR Microscope. Fixed Pattern Noise (FPN), Resulting From Pixel-to-pixel Response Non Uniformity, Is A Dominant Source Of Error Which Also Occurs Du

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Other Details

• Paper id:

  IJSARTV6I940411

• Published in:

  Volume: 6 Issue: 9 September 2020

• Publication Date:

  2020-09-05

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